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qualcomm

qcc5161_firmware

4 known vulnerabilities · sorted by CVSS score

CVE-2025-47317
HIGH7.8

Memory corruption due to global buffer overflow when a test command uses an invalid payload type.

qualcomm / fastconnect_6200_firmware+52
Local
Published Sep 24, 2025
CVE-2025-47318
HIGH7.5

Transient DOS while parsing the EPTM test control message to get the test pattern.

qualcomm / apq8017_firmware+202
Network
Published Sep 24, 2025
CVE-2025-47342
HIGH7.1

Transient DOS may occur when multi-profile concurrency arises with QHS enabled.

qualcomm / qcc5161_firmware+7
Network
Published Oct 9, 2025
CVE-2025-47370
MEDIUM6.5

Transient DOS when a remote device sends an invalid connection request during BT connectable LE scan.

qualcomm / ar8035_firmware+135
Adjacent
Published Nov 4, 2025